The Unit of Electron Microscopy Applied to Materials (UMEAP) of the Scientific and Technological Centers of the University of Barcelona (CCiTUB) is one of the 4 nodes of the ICTS ELECMI together with the CNME (National Center of Electron Microscopy) of the Complutense University of Madrid; the LMA (Advanced Microscopy Laboratory) of the University of Zaragoza and the DME (Electronic Microscopy Division) of the University of Cadiz.

It has highly specialized staff in techniques of characterization by transmission electron microscopy and related analytical techniques (EELS and EDXS Spectroscopy), as well as in advanced data processing and simulation. It also has beam precession systems (for 3D electron diffraction, electron crystallography, crystal phase recognition and orientation and tension maps) and specific sample holders for in situ microscopy and electron tomography.